summaryrefslogtreecommitdiffstats
path: root/include/kunit/of.h
diff options
context:
space:
mode:
authorDonggeun Yoo <donggeunyoo.kernel@gmail.com>2026-09-02 00:21:26 +0900
committerJonathan Cameron <jonathan.cameron@oss.qualcomm.com>2026-09-07 02:24:53 +0100
commite24328974a88aa8541e94e8bb8dfa2ade1b3c45d (patch)
tree43a2533acc955d11f5cb8be1ecba0ab8ba4cbb1e /include/kunit/of.h
downloadlinux-stable-e24328974a88aa8541e94e8bb8dfa2ade1b3c45d.tar.gz
linux-stable-e24328974a88aa8541e94e8bb8dfa2ade1b3c45d.zip
iio: proximity: vl53l0x-i2c: claim direct mode for raw readsgrafted
vl53l0x_read_raw() starts a single-shot ranging measurement and reads back the result. Once the triggered buffer is enabled the sensor runs in continuous mode and its data-ready interrupt is routed to the trigger, so a concurrent in_distance_raw read disturbs the streaming setup and never gets its completion, returning -ETIMEDOUT. The original submission claimed direct mode here, but it was dropped during review because the driver had no buffer support at the time [1]. Continuous (buffered) mode was later added without restoring the claim [2], reintroducing the conflict. Reject direct reads while buffered capture is active by claiming direct mode around the measurement, as the vl53l1x sibling already does. Fixes: 762186c6e7b1 ("iio: proximity: vl53l0x-i2c: Added continuous mode support") Link: https://lore.kernel.org/linux-iio/20180911160300.GA9212@himanshu-Vostro-3559/ [1] Link: https://lore.kernel.org/linux-iio/20240909101508.263085-3-abhashkumarjha123@gmail.com/ [2] Signed-off-by: Donggeun Yoo <donggeunyoo.kernel@gmail.com> Cc: stable@vger.kernel.org Signed-off-by: Jonathan Cameron <jonathan.cameron@oss.qualcomm.com>
Diffstat (limited to 'include/kunit/of.h')
-rw-r--r--include/kunit/of.h121
1 files changed, 121 insertions, 0 deletions
diff --git a/include/kunit/of.h b/include/kunit/of.h
new file mode 100644
index 000000000..75a760a4e
--- /dev/null
+++ b/include/kunit/of.h
@@ -0,0 +1,121 @@
+/* SPDX-License-Identifier: GPL-2.0 */
+#ifndef _KUNIT_OF_H
+#define _KUNIT_OF_H
+
+#include <kunit/test.h>
+
+struct device_node;
+
+#ifdef CONFIG_OF
+
+void of_node_put_kunit(struct kunit *test, struct device_node *node);
+
+#else
+
+static inline
+void of_node_put_kunit(struct kunit *test, struct device_node *node)
+{
+ kunit_skip(test, "requires CONFIG_OF");
+}
+
+#endif /* !CONFIG_OF */
+
+#if defined(CONFIG_OF) && defined(CONFIG_OF_OVERLAY) && defined(CONFIG_OF_EARLY_FLATTREE)
+
+int of_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt,
+ u32 overlay_fdt_size, int *ovcs_id);
+#else
+
+static inline int
+of_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt,
+ u32 overlay_fdt_size, int *ovcs_id)
+{
+ kunit_skip(test, "requires CONFIG_OF and CONFIG_OF_OVERLAY and CONFIG_OF_EARLY_FLATTREE for root node");
+ return -EINVAL;
+}
+
+#endif
+
+/**
+ * __of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() variant
+ * @test: test context
+ * @overlay_begin: start address of overlay to apply
+ * @overlay_end: end address of overlay to apply
+ *
+ * This is mostly internal API. See of_overlay_apply_kunit() for the wrapper
+ * that makes this easier to use.
+ *
+ * Similar to of_overlay_fdt_apply(), except the overlay is managed by the test
+ * case and is automatically removed with of_overlay_remove() after the test
+ * case concludes.
+ *
+ * Return: 0 on success, negative errno on failure
+ */
+static inline int __of_overlay_apply_kunit(struct kunit *test,
+ u8 *overlay_begin,
+ const u8 *overlay_end)
+{
+ int unused;
+
+ return of_overlay_fdt_apply_kunit(test, overlay_begin,
+ overlay_end - overlay_begin,
+ &unused);
+}
+
+#define of_overlay_begin(overlay_name) __dtbo_##overlay_name##_begin
+#define of_overlay_end(overlay_name) __dtbo_##overlay_name##_end
+
+#define OF_OVERLAY_DECLARE(overlay_name) \
+ extern uint8_t of_overlay_begin(overlay_name)[]; \
+ extern uint8_t of_overlay_end(overlay_name)[] \
+
+/**
+ * of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() for built-in overlays
+ * @test: test context
+ * @overlay_name: name of overlay to apply
+ *
+ * This macro is used to apply a device tree overlay built with the
+ * cmd_dt_S_dtbo rule in scripts/Makefile.lib that has been compiled into the
+ * kernel image or KUnit test module. The overlay is automatically removed when
+ * the test is finished.
+ *
+ * Unit tests that need device tree nodes should compile an overlay file with
+ * @overlay_name\.dtbo.o in their Makefile along with their unit test and then
+ * load the overlay during their test. The @overlay_name matches the filename
+ * of the overlay without the dtbo filename extension. If CONFIG_OF_OVERLAY is
+ * not enabled, the @test will be skipped.
+ *
+ * In the Makefile
+ *
+ * .. code-block:: none
+ *
+ * obj-$(CONFIG_OF_OVERLAY_KUNIT_TEST) += overlay_test.o kunit_overlay_test.dtbo.o
+ *
+ * In the test
+ *
+ * .. code-block:: c
+ *
+ * static void of_overlay_kunit_of_overlay_apply(struct kunit *test)
+ * {
+ * struct device_node *np;
+ *
+ * KUNIT_ASSERT_EQ(test, 0,
+ * of_overlay_apply_kunit(test, kunit_overlay_test));
+ *
+ * np = of_find_node_by_name(NULL, "test-kunit");
+ * KUNIT_EXPECT_NOT_ERR_OR_NULL(test, np);
+ * of_node_put(np);
+ * }
+ *
+ * Return: 0 on success, negative errno on failure.
+ */
+#define of_overlay_apply_kunit(test, overlay_name) \
+({ \
+ OF_OVERLAY_DECLARE(overlay_name); \
+ \
+ __of_overlay_apply_kunit((test), \
+ of_overlay_begin(overlay_name), \
+ of_overlay_end(overlay_name)); \
+})
+
+#endif