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| author | Donggeun Yoo <donggeunyoo.kernel@gmail.com> | 2026-09-02 00:21:26 +0900 |
|---|---|---|
| committer | Jonathan Cameron <jonathan.cameron@oss.qualcomm.com> | 2026-09-07 02:24:53 +0100 |
| commit | e24328974a88aa8541e94e8bb8dfa2ade1b3c45d (patch) | |
| tree | 43a2533acc955d11f5cb8be1ecba0ab8ba4cbb1e /include/kunit/of.h | |
| download | linux-stable-e24328974a88aa8541e94e8bb8dfa2ade1b3c45d.tar.gz linux-stable-e24328974a88aa8541e94e8bb8dfa2ade1b3c45d.zip | |
iio: proximity: vl53l0x-i2c: claim direct mode for raw readsgrafted
vl53l0x_read_raw() starts a single-shot ranging measurement and reads
back the result. Once the triggered buffer is enabled the sensor runs in
continuous mode and its data-ready interrupt is routed to the trigger,
so a concurrent in_distance_raw read disturbs the streaming setup and
never gets its completion, returning -ETIMEDOUT.
The original submission claimed direct mode here, but it was dropped
during review because the driver had no buffer support at the time [1].
Continuous (buffered) mode was later added without restoring the
claim [2], reintroducing the conflict.
Reject direct reads while buffered capture is active by claiming direct
mode around the measurement, as the vl53l1x sibling already does.
Fixes: 762186c6e7b1 ("iio: proximity: vl53l0x-i2c: Added continuous mode support")
Link: https://lore.kernel.org/linux-iio/20180911160300.GA9212@himanshu-Vostro-3559/ [1]
Link: https://lore.kernel.org/linux-iio/20240909101508.263085-3-abhashkumarjha123@gmail.com/ [2]
Signed-off-by: Donggeun Yoo <donggeunyoo.kernel@gmail.com>
Cc: stable@vger.kernel.org
Signed-off-by: Jonathan Cameron <jonathan.cameron@oss.qualcomm.com>
Diffstat (limited to 'include/kunit/of.h')
| -rw-r--r-- | include/kunit/of.h | 121 |
1 files changed, 121 insertions, 0 deletions
diff --git a/include/kunit/of.h b/include/kunit/of.h new file mode 100644 index 000000000..75a760a4e --- /dev/null +++ b/include/kunit/of.h @@ -0,0 +1,121 @@ +/* SPDX-License-Identifier: GPL-2.0 */ +#ifndef _KUNIT_OF_H +#define _KUNIT_OF_H + +#include <kunit/test.h> + +struct device_node; + +#ifdef CONFIG_OF + +void of_node_put_kunit(struct kunit *test, struct device_node *node); + +#else + +static inline +void of_node_put_kunit(struct kunit *test, struct device_node *node) +{ + kunit_skip(test, "requires CONFIG_OF"); +} + +#endif /* !CONFIG_OF */ + +#if defined(CONFIG_OF) && defined(CONFIG_OF_OVERLAY) && defined(CONFIG_OF_EARLY_FLATTREE) + +int of_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt, + u32 overlay_fdt_size, int *ovcs_id); +#else + +static inline int +of_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt, + u32 overlay_fdt_size, int *ovcs_id) +{ + kunit_skip(test, "requires CONFIG_OF and CONFIG_OF_OVERLAY and CONFIG_OF_EARLY_FLATTREE for root node"); + return -EINVAL; +} + +#endif + +/** + * __of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() variant + * @test: test context + * @overlay_begin: start address of overlay to apply + * @overlay_end: end address of overlay to apply + * + * This is mostly internal API. See of_overlay_apply_kunit() for the wrapper + * that makes this easier to use. + * + * Similar to of_overlay_fdt_apply(), except the overlay is managed by the test + * case and is automatically removed with of_overlay_remove() after the test + * case concludes. + * + * Return: 0 on success, negative errno on failure + */ +static inline int __of_overlay_apply_kunit(struct kunit *test, + u8 *overlay_begin, + const u8 *overlay_end) +{ + int unused; + + return of_overlay_fdt_apply_kunit(test, overlay_begin, + overlay_end - overlay_begin, + &unused); +} + +#define of_overlay_begin(overlay_name) __dtbo_##overlay_name##_begin +#define of_overlay_end(overlay_name) __dtbo_##overlay_name##_end + +#define OF_OVERLAY_DECLARE(overlay_name) \ + extern uint8_t of_overlay_begin(overlay_name)[]; \ + extern uint8_t of_overlay_end(overlay_name)[] \ + +/** + * of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() for built-in overlays + * @test: test context + * @overlay_name: name of overlay to apply + * + * This macro is used to apply a device tree overlay built with the + * cmd_dt_S_dtbo rule in scripts/Makefile.lib that has been compiled into the + * kernel image or KUnit test module. The overlay is automatically removed when + * the test is finished. + * + * Unit tests that need device tree nodes should compile an overlay file with + * @overlay_name\.dtbo.o in their Makefile along with their unit test and then + * load the overlay during their test. The @overlay_name matches the filename + * of the overlay without the dtbo filename extension. If CONFIG_OF_OVERLAY is + * not enabled, the @test will be skipped. + * + * In the Makefile + * + * .. code-block:: none + * + * obj-$(CONFIG_OF_OVERLAY_KUNIT_TEST) += overlay_test.o kunit_overlay_test.dtbo.o + * + * In the test + * + * .. code-block:: c + * + * static void of_overlay_kunit_of_overlay_apply(struct kunit *test) + * { + * struct device_node *np; + * + * KUNIT_ASSERT_EQ(test, 0, + * of_overlay_apply_kunit(test, kunit_overlay_test)); + * + * np = of_find_node_by_name(NULL, "test-kunit"); + * KUNIT_EXPECT_NOT_ERR_OR_NULL(test, np); + * of_node_put(np); + * } + * + * Return: 0 on success, negative errno on failure. + */ +#define of_overlay_apply_kunit(test, overlay_name) \ +({ \ + OF_OVERLAY_DECLARE(overlay_name); \ + \ + __of_overlay_apply_kunit((test), \ + of_overlay_begin(overlay_name), \ + of_overlay_end(overlay_name)); \ +}) + +#endif |
